Daniel Hahn joined Fraunhofer IZM as a research scientist in 2011. He studied electrical engineering at the Technical University of Berlin. Due to his academic focus on microsystems engineering, he is interested in the reliability of electronic systems, especially microsystems engineering, and the manifold interactions of technologies in these systems.

His research focuses on the development of methods for application-oriented testing (including topics such as mission profiles, aging models, accelerated testing, system reliability and statistics).