Daniel Hahn joined Fraunhofer IZM as a research scientist in 2011. He studied electrical engineering at the Technical University of Berlin. Due to his academic focus on microsystems engineering, he is interested in the reliability of electronic systems, especially microsystems engineering, and the manifold interactions of technologies in these systems. His research focuses on the development of methods for application-oriented testing (including topics such as mission profiles, aging models, accelerated testing, system reliability and statistics).
In recent years, the amount of electronic waste in the EU has risen sharply. Short product lifetimes and insufficient consumer information about the repairability of products contribute to the premature disposal of electronic equipment. The EU is trying to tackle…
When developing and bringing new products to market, knowing its lifetime can be essential. Manufacturers want their products to work for a specific period of time or number of uses, but things break and products fail. To know when and…
