Daniel Hahn has been with the Fraunhofer Institute for Reliability and Microintegration as a scientist since 2011. He originally studied electrical engineering at the Technical University of Berlin. His academic focus on microsystems technology has left him with an interests in the reliability of electronic systems, especially microsystems technologies, and the many ways that technologies interact in these systems. In his research, he focuses on the development of procedures for application-oriented testing (including topics like mission profiles, aging models, accelerated testing, system reliability, and statistics).
When developing and bringing new products to market, knowing its lifetime can be essential. Manufacturers want their products to work for a specific period of time or number of uses, but things break and products fail. To know when and…
