Dr. Olaf Wittler studied physics in Paderborn, Berlin and London. He received his diploma in 1999 and his doctorate in 2004 from the Technical University of Berlin. His professional experience includes various positions at Robert Bosch GmbH, TU Berlin and Fraunhofer IZM, where he is currently a senior scientist in the field of “Technology Reliability Simulation”. He is author and co-author of more than 100 conference and journal papers. He is actively involved in peer review, teaching and association work. In 2022, he took over the co-chairmanship of ESREF, a conference on electronics reliability, in Berlin. His current research interests include warpage prediction in FO-WLP, FO-PLP and PCB embedded packages, reliability and aging of RF packages and materials, advanced damage modeling in power electronics interconnect technologies, and reliability of substrates and via technologies.
In recent years, the amount of electronic waste in the EU has risen sharply. Short product lifetimes and insufficient consumer information about the repairability of products contribute to the premature disposal of electronic equipment. The EU is trying to tackle…
Communication networks like 5G need the many modules and components that make them up to be robust and long-lasting, whatever the environmental conditions or other circumstances may be. Researchers at Fraunhofer IZM have now developed a testing method which allows…
Driven by the digital and ecological transition, the term “eco-reliability” has gained increased popularity within the last years. The main objective of this article is to present this new approach from its complementary perspectives “ecology and reliability” and to highlight…
